Using computer and PLC control technology, the main performance can meet the needs of various combined wave testing for SPD products and devices at home and abroad
Can produce impulse voltage (1.2/50μs) and impulse current (8/20μs)

KDLJ-40 lightning shock test device In order to improve the degree of test automation, the device uses computer and PLC control technology, the main performance to meet the domestic and foreign SPD products and devices for all kinds of combined wave testing requirements.

The main technical parameters of the test platform are:
Input power: AC220V/2kVA, 50Hz/60Hz
Maximum DC charging voltage: DC42kV, maximum charging current 0.1A
Charging time: 42kV40s~60s to complete
Charge voltage setting: Test initialization for charge voltage preset and setting
Residual pressure level: ≤2.5kV
Automatic polarity conversion: The number of positive and negative polarity shocks can be set separately.
Automatic phase tracking, 0-359° adjustable
Action load power supply AC5-500V/5A, built-in decoupling capacitor, inductance. Manual boost, buck, head display.
Combined wave impact generator loop
Capacity: 8uF charging voltage 35kV
Output capacity: 10%~110%, inverse peak <20%(no decoupling load)
Open circuit voltage waveform: T1:1.2±30%, T2:50±10%
Short-circuit current waveform: T1:8±10%, T2:20±10%(not connected to decoupling load)
Short-circuit current waveform: T1:8±20%, T2:20±20%(connected to decoupling load)
Output impedance: 2 ohms ±10%
Sample cabinet: Width x diameter x height =400*400*300mm (can also be customized according to customer requirements)
Cabinet size: width x diameter x height =600*800*1700mm
Weight: About 600 kg
 

Spec	Application	Test
200kV5kJ	Without a cutoff device, an oscilloscope, or a data acquisition card	6-10kV level switches and insulators; lightning impulse voltage full-wave test, waveform 1.2/50µs.
200kV10kJ	Without a cutoff device, an oscilloscope, or a data acquisition card	6-10kV level switches and insulators; transformers and instrument transformers requiring no chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs
200kV10kJ	With cutoff device, Tektronix 1102 oscilloscope or data acquisition card	6-10kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
300kV7.5kJ	Without cutoff device, oscilloscope, or data acquisition card	10-35kV level switches and insulators; lightning impulse voltage full-wave test, waveform 1.2/50µs
300kV15kJ	Without cutoff device, Tektronix 1102 oscilloscope or data acquisition card	10-35kV level switches and insulators; transformers and instrument transformers requiring no chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs
300kV15kJ	300kV single-stage cutoff device, oscilloscope, or data acquisition card	10-35kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
300kV30kJ	300kV single-stage cutoff device, Tektronix 2012 oscilloscope or data acquisition card	10-35kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
400kV10kJ	Without cutoff device, oscilloscope	10-35kV level switches and insulators; lightning impulse voltage full-wave test, waveform 1.2/50µs
400kV20kJ	400kV single-stage cutoff device, oscilloscope	10-35kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
400kV20kJ	Without cutoff device, oscilloscope, or data acquisition card	10-35kV level switches and insulators; transformers and instrument transformers requiring no chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs
400kV30kJ	300kV single-stage cutoff device, oscilloscope	10-35kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
400kV40kJ	Without cutoff device, oscilloscope, or data acquisition card	10-35kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
600kV15kJ	600kV single-stage steepening device, data acquisition card	10-35kV level switches; insulators requiring steep wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; steep wave
600kV30kJ	400kV single-stage cutoff device, oscilloscope	10-66kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
500kV30kJ	Single-stage cutoff device, oscilloscope
800kV20kJ		10-110kV level switches and insulators; transformers and instrument transformers requiring no chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs
800kV40kJ	Without cutoff device, oscilloscope	10-110kV level switches and insulators; transformers and instrument transformers requiring no chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs
800kV40kJ	800kV cutoff device, oscilloscope	10-110kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs
800kV80kJ	800kV cutoff device, oscilloscope	10-110kV level switches and insulators; transformers and instrument transformers requiring chopped-wave test; lightning impulse voltage full-wave test, waveform 1.2/50µs; chopped wave 2-6µs